GE Unveils phoenix|x-ray Live Inspection Boosted by Advanced Flash! Filters™ Image Optimization Technology at productronica 2013
GE presents intuitive and fast manual & automated high defect coverage X-ray inspection software at hall A2, booth 277
WUNSTORF, GERMANY - Nov. 12, 2013 -GE’s (NYSE: GE) Measurement & Control business today unveiled the phoenix x|act, a powerful software package for manual as well as automated X-ray inspection at productronica 2013, the world’s leading electronics production and inspection international trade fair being held this week in Munich, Germany.
A significantly enhanced version of GE’s advanced 2D electronics inspection software, the new phoenix x|act sets new standards in combining ease of use with excellence in X-ray inspection performance, while offering fast and easy CAD-based programming. The innovative solution features improved modules for intuitive BGA inspection and voiding calculation in IC die attaches and area solderings in power electronics - even in irregular shaped regions of interest.
To complement GE phoenix|x-ray capabilities, the phoenix x|act software is now available with an optional Flash! Filters™ technology option, which provides outstanding image enhancement during live inspection tasks. This innovative GE technology automates the filtering process of all grey scales - which are present in each X-ray image - to optimize contrast and brightness for the human eye, resulting in faster and more reliable identification of defects. In combination with GE advanced DXR digital detector arrays installed in the phoenix microme|x and nanome|x systems, Flash! Filters™ technology leads to significant time savings and defect coverage improvements in electronics inspection.
“Available in base, operator and pro configuration for the phoenix microme|x and nanome|x systems, GE’s unique x|act software package offers CAD data-based programming capabilities, while offering a suite of intuitive, built-in software tools to make X-ray inspection easier than ever before,” said Dr. Oliver Brunke, Senior Product Manager, GE’s Measurement & Control, a GE Oil & Gas division. “New enhancements allow new and unskilled operators to gain high quality results after minimal training. Ease-of-use functions - such as intuitive sample manipulation, wizard-guided inspection modules for easy setup, instant and clear live-imaging, live Pad ID overlay for easy defect identification and automatic report generation - enable inspectors to reach a high defect coverage after very short inspection times.”
To preview the GE phoenix x|act with enhanced Flash! Filters™ technology, please visit the GE productronica booth #277, located in hall A2. Additionally, visitors are invited to bring their samples with them, and can participate in interactive X-ray inspection demos as well as high resolution 3D CT scans performed on GE’s advanced phoenix nanotom m nanoCT® system. For more information, please visit: www.ge-mcs.com/phoenix.
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About About GE Measurement & Control
GE Measurement & Control is a leading innovator in advanced, sensor-based measurement; non-destructive testing and inspection; flow and process control; turbine, generator, and plant controls; and condition monitoring. Providing healthcare for our customers’ most critical assets, we deliver accuracy, productivity and safety to a wide range of industries, including oil & gas, power generation, aerospace, metals and transportation. Headquartered in Boston, USA, Measurement & Control has more than 40 facilities in 25 countries and is part of GE Oil & Gas. For further information, visit www.ge-mcs.com.
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