phoenix microme|x Microfocus X-ray System

The phoenix microme|x is a high-resolution 180 kV microfocus X-ray inspection system for real time inspection of solder joints and electronic components as well as for automated inspection (µAXI). Innovative and unique features and an extreme high positioning accuracy make the system the effective and reliable solution for a wide spectrum of 2D and 3D inspection tasks: R&D, failure analysis, process and quality control as well as automated offline inspection. Optional the system can be equipped with CT or planarCT.

phoenix nanomex and micromex systems brochure

Request a Quote

Pricing available upon request

Features and Benefits

Product Downloads


  • GE Updates XL Series of Video Borescopes for Remote Visual Inspection

    New feature updates to versatile, industry-proven utility VideoProbe™


    Read More

  • GE Brings Digital Solutions to Nondestructive Testing (NDT) Industry

    Mentor UT™ Improves Productivity with the Power of Apps and Live Wireless Collaboration...

    Read More

View all News

Tech Alerts

  • GE Releases Advanced Calibrator and HART/Foundation Fieldbus Communicator to Provide Greater Productivity in Hazardous Areas in the Process Industry

    Latest Intrinsically Safe Druck DPI620 Genii IS offers world-class measurement and calibration with ATEX and IECEx Approvals


    Read More

  • GE Strengthens OT Environments with IEC Cyber Security Standards

    Leading industrial control solutions now compliant with IEC 62443-2-4 standards for enhanced security

    Longmont, CO—April...

    Read More

View all Tech Alerts


Looking for software, a brochure, or a manual?
Visit the download center to find documents and software related to our products.

View Download Center

Contact Us

Contact us to learn more about how we are transforming the future of industry with our digital products, software and service solutions.